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Simulated admittance spectroscopy measurements of high concentration deep level defects in CdTe thin-film solar cells
Seymour, Fred H., Kaydanov, Victor, Ohno, Tim R.Volume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2220491
File:
PDF, 352 KB
english, 2006