Principal Line-Based Alignment Refinement for Palmprint...

IEEE Transactions on Systems Man and Cybernetics Part C (Applications and Reviews) 2012 / 11 Vol. 42; Iss. 6

Principal Line-Based Alignment Refinement for Palmprint Recognition

Li, Wei, Zhang, Bob, Zhang, Lei, Yan, Jingqi
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Systems, Man, and Cybernetics, Part C (Applications and Reviews)
DOI:
10.1109/TSMCC.2012.2195653
Date:
November, 2012
File:
PDF, 1.01 MB
english, 2012
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