Modeling Undeposited CNTs for CNTFET Operation

IEEE Transactions on Device and Materials Reliability 2011 / 06 Vol. 11; Iss. 2

Modeling Undeposited CNTs for CNTFET Operation

Cho, Geunho, Kim, Yong-Bin, Lombardi, Fabrizio
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Volume:
11
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2011.2123896
Date:
June, 2011
File:
PDF, 618 KB
english, 2011
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