Gate All Around MOSFET With Vacuum Gate Dielectric for...

IEEE Transactions on Electron Devices 2013 / 06 Vol. 60; Iss. 6

Gate All Around MOSFET With Vacuum Gate Dielectric for Improved Hot Carrier Reliability and RF Performance

Gautam, Rajni, Saxena, Manoj, Gupta, Radhey Shyam, Gupta, Mridula
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2256912
Date:
June, 2013
File:
PDF, 1.27 MB
english, 2013
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