Transistor Variability Modeling and its Validation With...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2010 / 07 Vol. 18; Iss. 7

Transistor Variability Modeling and its Validation With Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits

Fuketa, Hiroshi, Hashimoto, Masanori, Mitsuyama, Yukio, Onoye, Takao
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Volume:
18
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2009.2020594
Date:
July, 2010
File:
PDF, 1.08 MB
english, 2010
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