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First experimental proof for aberration correction in XPEEM: Resolution, transmission enhancement, and limitation by space charge effects
Schmidt, Th., Sala, A., Marchetto, H., Umbach, E., Freund, H.-J.Volume:
126
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2012.11.004
Date:
March, 2013
File:
PDF, 842 KB
english, 2013