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Spectrum distortion in far-infrared Fourier spectroscopy by multiple reflections between sample and Michelson interferometer
H.W.H.M. Jongbloets, M.J.H. van de Steeg, E.J.C.M. van der Werf, J.H.M. Stoelinga, P. WyderVolume:
20
Year:
1980
Language:
english
Pages:
8
DOI:
10.1016/0020-0891(80)90026-3
File:
PDF, 576 KB
english, 1980