[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Effective and Efficient Test Pattern Generation for Small Delay Defect
Goel, Sandeep Kumar, Devta-Prasanna, Narendra, Turakhia, Ritesh P.Year:
2009
Language:
english
DOI:
10.1109/VTS.2009.28
File:
PDF, 747 KB
english, 2009