[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa...

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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Effective and Efficient Test Pattern Generation for Small Delay Defect

Goel, Sandeep Kumar, Devta-Prasanna, Narendra, Turakhia, Ritesh P.
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Year:
2009
Language:
english
DOI:
10.1109/VTS.2009.28
File:
PDF, 747 KB
english, 2009
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