SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Oxide-based Materials and Devices II - Radiation damage formation and annealing in GaN and ZnO
Lorenz, K., Peres, M., Franco, N., Marques, J. G., Miranda, S. M. C., Magalhães, S., Monteiro, T., Wesch, W., Alves, E., Wendler, E., Teherani, Ferechteh H., Look, David C., Rogers, David J.Volume:
7940
Year:
2011
Language:
english
DOI:
10.1117/12.879402
File:
PDF, 651 KB
english, 2011
File converter
More search results
More benefits 
