Quantitative Raman Spectrum and Reliable Thickness...

ACS Nano 2012 / 08 Vol. 6; Iss. 8

Quantitative Raman Spectrum and Reliable Thickness Identification for Atomic Layers on Insulating Substrates

Li, Song-Lin, Miyazaki, Hisao, Song, Haisheng, Kuramochi, Hiromi, Nakaharai, Shu, Tsukagoshi, Kazuhito
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Volume:
6
Language:
english
Journal:
ACS Nano
DOI:
10.1021/nn3025173
Date:
August, 2012
File:
PDF, 2.39 MB
english, 2012
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