Single-Error-Correction Code for Simultaneous Testing of...

Single-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays for Word-Oriented Memories

Cha, Sanguhn, Yoon, Hongil
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2237774
Date:
March, 2013
File:
PDF, 439 KB
english, 2013
Conversion to is in progress
Conversion to is failed