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Single-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays for Word-Oriented Memories
Cha, Sanguhn, Yoon, HongilVolume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2237774
Date:
March, 2013
File:
PDF, 439 KB
english, 2013