Reliability prediction and failure mode effects and...

International Journal of Quality & Reliability Management 2005 / 02 Vol. 22; Iss. 2

Reliability prediction and failure mode effects and criticality analysis (FMECA) of electronic devices using fuzzy logic

Zafiropoulos, E.P., Dialynas, E.N.
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Volume:
22
Language:
english
Journal:
International Journal of Quality & Reliability Management
DOI:
10.1108/02656710510577233
Date:
February, 2005
File:
PDF, 368 KB
english, 2005
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