SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Polarization: Measurement, Analysis, and Remote Sensing X - Optical characterization of a micro-grid polarimeter
Fourspring, Kenneth, Ninkov, ZoranVolume:
8364
Year:
2012
Language:
english
DOI:
10.1117/12.919301
File:
PDF, 6.33 MB
english, 2012