![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Polarization: Measurement, Analysis, and Remote Sensing X - Mueller matrix by imaging polarimeter
Kim, Charles C., Thai, Bea, Edwards, David, Coker, CharlesVolume:
8364
Year:
2012
Language:
english
DOI:
10.1117/12.917808
File:
PDF, 2.83 MB
english, 2012