Surface Characterization of CeO 2 /SiO 2 and V 2 O 5 /CeO 2 /SiO 2 Catalysts by Raman, XPS, and Other Techniques
Reddy, Benjaram M., Khan, Ataullah, Yamada, Yusuke, Kobayashi, Tetsuhiko, Loridant, Stéphane, Volta, Jean-ClaudeVolume:
106
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp021195v
Date:
October, 2002
File:
PDF, 236 KB
english, 2002