SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Polarization: Measurement, Analysis, and Remote Sensing X - Examining epsilon near zero structures through effective medium theory and optical thin film analysis
Vap, Jason C., Marciniak, Michael A., Moran, Mark, Johnson, LindaVolume:
8364
Year:
2012
Language:
english
DOI:
10.1117/12.919053
File:
PDF, 242 KB
english, 2012