Validating Raman spectroscopic calibrations of phonon...

Validating Raman spectroscopic calibrations of phonon deformation potentials in silicon single crystals: A comparison between ball-on-ring and micro-indentation methods

Miyatake, Takahiro, Pezzotti, Giuseppe
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Volume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3656447
File:
PDF, 1.60 MB
english, 2011
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