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Role of Ti and Pt electrodes on resistance switching variability of HfO2-based Resistive Random Access Memory
Cabout, T., Buckley, J., Cagli, C., Jousseaume, V., Nodin, J.-F., de Salvo, B., Bocquet, M., Muller, Ch.Volume:
533
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.11.050
Date:
April, 2013
File:
PDF, 434 KB
english, 2013