Reliability Impact of N-Modular Redundancy in QCA

IEEE Transactions on Nanotechnology 2011 / 09 Vol. 10; Iss. 5

Reliability Impact of N-Modular Redundancy in QCA

Dysart, Timothy J., Kogge, Peter M.
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2010.2099131
Date:
September, 2011
File:
PDF, 631 KB
english, 2011
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