SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Polarization: Measurement, Analysis, and Remote Sensing X - Polarimetric wavelet fractal remote sensing principles for space materials
Giakos, George C., Picard, Richard H., Dao, Phan D., Crabtree, Peter N., McNicholl, Patrick J., Petermann, Jeff, Shrestha, Suman, Narayan, Chaya, Marotta, StefanieVolume:
8364
Year:
2012
Language:
english
DOI:
10.1117/12.920487
File:
PDF, 2.58 MB
english, 2012