Spectral response measurement of double-junction thin-film...

Measurement Science and Technology 2011 / 04 Vol. 22; Iss. 4

Spectral response measurement of double-junction thin-film photovoltaic devices: the impact of shunt resistance and bias voltage

Pravettoni, Mauro, Galleano, Roberto, Virtuani, Alessandro, Müllejans, Harald, Dunlop, Ewan D
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Volume:
22
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/22/4/045902
Date:
April, 2011
File:
PDF, 1.31 MB
english, 2011
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