Scanning-Raman-Microscopy for the Statistical Analysis of Covalently Functionalized Graphene
Englert, Jan M., Vecera, Philipp, Knirsch, Kathrin C., Schäfer, Ricarda A., Hauke, Frank, Hirsch, AndreasVolume:
7
Language:
english
Journal:
ACS Nano
DOI:
10.1021/nn401481h
Date:
June, 2013
File:
PDF, 1.97 MB
english, 2013