Enhanced bias stress stability of a-InGaZnO thin film...

Enhanced bias stress stability of a-InGaZnO thin film transistors by inserting an ultra-thin interfacial InGaZnO:N layer

Huang, Xiaoming, Wu, Chenfei, Lu, Hai, Ren, Fangfang, Chen, Dunjun, Zhang, Rong, Zheng, Youdou
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Volume:
102
Year:
2013
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4805354
File:
PDF, 962 KB
english, 2013
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