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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Sensors, Cameras, and Systems for Industrial/Scientific Applications XI - Improved sensitivity high-definition interline CCD using the KODAK TRUESENSE color filter pattern
DiBella, James, Andreghetti, Marco, Enge, Amy, Chen, William, Stanka, Timothy, Kaser, Robert, Bodegom, Erik, Nguyen, ValérieVolume:
7536
Year:
2010
Language:
english
DOI:
10.1117/12.845624
File:
PDF, 10.58 MB
english, 2010