Effect of surface roughness on electrical characteristics in amorphous InGaZnO thin-film transistors with high-κ Sm2O3 dielectrics
Chen, Fa-Hsyang, Hung, Meng-Ning, Yang, Jui-Fu, Kuo, Shou-Yi, Her, Jim-Long, Matsuda, Yasuhiro H., Pan, Tung-MingVolume:
74
Language:
english
Journal:
Journal of Physics and Chemistry of Solids
DOI:
10.1016/j.jpcs.2012.12.006
Date:
April, 2013
File:
PDF, 688 KB
english, 2013