Conductive Filament Scaling of ${\rm TaO}_{\rm x}$ Bipolar ReRAM for Improving Data Retention Under Low Operation Current
Ninomiya, Takeki, Wei, Zhigiang, Muraoka, Shusaku, Yasuhara, Ryutaro, Katayama, Koji, Takagi, TakeshiVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2248157
Date:
April, 2013
File:
PDF, 814 KB
english, 2013