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In-situ transmission electron microscopy of conductive filaments in NiO resistance random access memory and its analysis
Fujii, Takashi, Arita, Masashi, Hamada, Kouichi, Takahashi, Yasuo, Sakaguchi, NorihitoVolume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4792732
File:
PDF, 1.34 MB
english, 2013