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The Non-homologous End-Joining (NHEJ) Mathematical Model for the Repair of Double-Strand Breaks: II. Application to Damage Induced by Ultrasoft X Rays and Low-Energy Electrons
Taleei, Reza, Girard, Peter M., Sankaranarayanan, Krishnaswami, Nikjoo, HooshangVolume:
179
Language:
english
Journal:
Radiation Research
DOI:
10.1667/RR3124.1
Date:
May, 2013
File:
PDF, 608 KB
english, 2013