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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices || GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors

Ueda, Osamu, Pearton, Stephen J.
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Volume:
10.1007/97
Year:
2013
Language:
english
DOI:
10.1007/978-1-4614-4337-7_14
File:
PDF, 502 KB
english, 2013
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