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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2007 - San Jose, CA (Saturday 20 January 2007)] Zinc Oxide Materials and Devices II - Vacancy defect distributions in bulk ZnO crystals
Tuomisto, Filip, Look, David C., Hosseini Teherani, Ferechteh, Litton, Cole W.Volume:
6474
Year:
2007
Language:
english
DOI:
10.1117/12.698902
File:
PDF, 270 KB
english, 2007