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Microwave photoconductivity decay characterization of high-purity 4H-SiC substrates
Kumar, R. J., Borrego, J. M., Gutmann, R. J., Jenny, J. R., Malta, D. P., Hobgood, H. McD., Carter, C. H.Volume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2751086
File:
PDF, 1.30 MB
english, 2007