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Determining the Electronic Properties of Individual Nanointerfaces by Combining Intermittent AFM Imaging and Contact Spectroscopy
Kraya, Ramsey, Bonnell, Dawn A.Volume:
9
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2010.2047024
Date:
November, 2010
File:
PDF, 240 KB
english, 2010