SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Applications - Application of digital speckle pattern interferometry in measurement of large deformation
Kumar, Rajesh, Rathi, Vikas, Mirza, Saba, Shakher, Chandra, Osten, Wolfgang, Novak, ErikVolume:
5532
Year:
2004
Language:
english
DOI:
10.1117/12.559560
File:
PDF, 423 KB
english, 2004