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Examination of compact bone microdamage using back-scattered electron microscopy
Schaffler, M.B., Pitchford, W.C., Choi, K., Riddle, J.M.Volume:
15
Language:
english
Journal:
Bone
DOI:
10.1016/8756-3282(94)90271-2
Date:
September, 1994
File:
PDF, 706 KB
english, 1994