UV and visible Raman scattering of ultraheavily Ti...

Semiconductor Science and Technology 2011 / 11 Vol. 26; Iss. 11

UV and visible Raman scattering of ultraheavily Ti implanted Si layers for intermediate band formation

Pastor, D, Olea, J, del Prado, A, García-Hemme, E, Mártil, I, González-Díaz, G, Ibáñez, J, Cuscó, R, Artús, L
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Volume:
26
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/26/11/115003
Date:
November, 2011
File:
PDF, 581 KB
english, 2011
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