Tip-Induced Deformation of Graphene on SiO$_{2}$ Assessed by Capacitance Measurement
Naitou, YuichiVolume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.51.115101
Date:
November, 2012
File:
PDF, 613 KB
english, 2012