Tip-Induced Deformation of Graphene on SiO$_{2}$ Assessed...

Tip-Induced Deformation of Graphene on SiO$_{2}$ Assessed by Capacitance Measurement

Naitou, Yuichi
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Volume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.51.115101
Date:
November, 2012
File:
PDF, 613 KB
english, 2012
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