SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Optical metrology: from the laboratory to the real world
Osten, W., Garbusi, E., Fleischle, D., Lyda, W., Pruss, C., Reichle, R., Falldorf, C., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.873356
File:
PDF, 8.93 MB
english, 2010