SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Quality and Reliability for Optical Systems - Null test for null correctors: error analysis
Burge, James H., Bilbro, James W., Parks, Robert E.Volume:
1993
Year:
1993
Language:
english
DOI:
10.1117/12.164976
File:
PDF, 1.08 MB
english, 1993