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Stress-induced optical anisotropies measured by modulated reflectance
Lastras-Martínez, L F, Balderas-Navarro, R E, Lastras-Martínez, A, Hingerl, KVolume:
19
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/19/9/R01
Date:
September, 2004
File:
PDF, 502 KB
english, 2004