In situ comprehensive characterization of...

Nanotechnology 2009 / 04 Vol. 20; Iss. 17

In situ comprehensive characterization of optoelectronic nanomaterials for device purposes

Li, Chengyao, Gao, Min, Ding, Chen, Zhang, Xiaoxian, Zhang, Lihuan, Chen, Qing, Peng, Lian-Mao
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Volume:
20
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/20/17/175703
Date:
April, 2009
File:
PDF, 783 KB
english, 2009
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