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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Penetrating Radiation Systems and Applications IX - A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design
Nguyen, D., Cormican, H., Baysal, A., Wiswall, C., Kerr, T., Wang, J. M., Ma, D., Doty, F. Patrick, Barber, H. Bradford, Roehrig, Hans, Schirato, Richard C.Volume:
7080
Year:
2008
Language:
english
DOI:
10.1117/12.792554
File:
PDF, 635 KB
english, 2008