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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - A novel diffractive encoding principle for absolute optical encoders
Hopp, D., Wibbing, D., Pruss, C., Osten, W., Binder, J., Schinköthe, W., Sterns, F., Seybold, J., Fritz, K.-P., Mayer, V., Kück, H., Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.891800
File:
PDF, 6.26 MB
english, 2011