Material Characterization Using Ion Beams || Backscattering...

Material Characterization Using Ion Beams || Backscattering Analysis with MeV 4He Ions

Thomas, J. P., Cachard, A.

How much do you like this book?

What’s the quality of the file?

Download the book for quality assessment

What’s the quality of the downloaded files?

Volume:

10.1007/97

Year:

1978

Language:

english

DOI:

10.1007/978-1-4684-0856-0_10

File:

PDF, 2.72 MB

english, 1978

Conversion to is in progress

Conversion to is failed