SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Photonic Microdevices/Microstructures for Sensing IV - FIB-assisted a-SiGe:H/a-SiC:H alloy analysis for ultra-low biased multispectral pi<sup>x</sup>n sensors with enhanced color separation features and low reflective ZnO:Al back-contacts

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