In situ transmission electron microscopy...

Nanotechnology 2011 / 05 Vol. 22; Iss. 20

In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing

Gao, B, Rudneva, M, McGarrity, K S, Xu, Q, Prins, F, Thijssen, J M, Zandbergen, H, van der Zant, H S J
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Volume:
22
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/22/20/205705
Date:
May, 2011
File:
PDF, 1.00 MB
english, 2011
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