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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Forensic practice in the field of protection of cultural heritage
Kotrlý, Marek, Turková, IvanaVolume:
8378
Year:
2012
Language:
english
DOI:
10.1117/12.919290
File:
PDF, 593 KB
english, 2012