SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Extension of gravity center method for diameter calibration of polystyrene standard particles with a metrological AFM
Misumi, Ichiko, Takahata, Keiji, Sugawara, Kentaro, Gonda, Satoshi, Ehara, KenseiVolume:
8378
Year:
2012
Language:
english
DOI:
10.1117/12.918528
File:
PDF, 807 KB
english, 2012