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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Past, present, and future of backscatter electron (BSE) imaging
Wells, Oliver C., Gordon, Michael S., Gignac, Lynne M.Volume:
8378
Year:
2012
Language:
english
DOI:
10.1117/12.920001
File:
PDF, 194 KB
english, 2012