Simulation of Semiconductor Processes and Devices 2007 ||...

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Simulation of Semiconductor Processes and Devices 2007 || Modeling and Characterization of Advanced Phosphorus Ultra Shallow Junction Using Germanium and Carbon Coimplants

Grasser, Tibor, Selberherr, Siegfried
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Volume:
10.1007/97
Year:
2007
Language:
english
DOI:
10.1007/978-3-211-72861-1_8
File:
PDF, 231 KB
english, 2007
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