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Molecular Modeling and Multiscaling Issues for Electronic Material Applications || Roles of Grain Boundaries in the Strength of Metals by Using Atomic Simulations

Iwamoto, Nancy, Yuen, Matthew M.F., Fan, Haibo
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Volume:
10.1007/97
Year:
2012
Language:
english
DOI:
10.1007/978-1-4614-1728-6_4
File:
PDF, 2.29 MB
english, 2012
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